SiliconAid Solutions seeks guidance and advice from an advisory board consisting of Design-for-Test and SoC development industry leaders. They are essential in delivering the best quality possible to our customers.
Magdy
S. Abadir
Received the B.S. degree with honors in Computer Science from the University of
Alexandria, Egypt in 1978, the M.S. degree in Computer Science from the
University of Saskatchewan, Saskatoon, Canada, in 1981, and the Ph.D. degree in
Electrical Engineering from the University of Southern California, Los Angeles,
in 1985. He worked at Motorola as the Manager of the High Performance Tools and
Methodology Group at the Advanced Systems and Platform Group in Austin Texas.
Prior to that he was the General Manager of Best IC Labs in Austin Texas. From
1986 to 1994 he worked at the Microelectronics and Computer Technology
Corporation (MCC). He is also an adjunct faculty member of the Computer
Engineering Department at the University of Texas at Austin. Dr. Abadir has
published over 100 technical journal and conference papers in the areas of
microprocessor test and verification, test economics, expert systems, and design
for test. He founded and chaired three workshops on microprocessor test and
verification. He also co-chaired five workshops on the economics of design, test
and manufacturing. He co-edited three books on the subject of test economics. He
is a senior member of the IEEE.
President:
Bennetts Associates : Retired
Dr. R.G. "Ben" Bennetts is retired from being President of Bennetts Associates
and an independent consultant in Design-For-Test (DFT), consulting in product
life-cycle DFT strategies, and delivering on-site and open educational courses
in DFT technologies. In a career spanning over thirty years, he has worked in
the Electronic Design Automation industry with LogicVision (96 - 97) and
Synopsys (93 - 95), where he assisted with the specification of DFT synthesis
products and development of the DFT market. Ben has extensive experience as an
independent DFT consultant (86 - 93) advising on technical and marketing
activities in test technology, test strategies and DFT techniques for ASICs,
boards and systems and lecturing extensively on these topics. During this time,
he was a member of JTAG, the organization that created the IEEE 1149.1
Boundary-Scan Standard.
Chief
Scientist: ASSET INTERTECH
Mr. Crouch is responsible for research and the generation of development plans
for new DFT methodologies, as well as providing technical consultancy to
semiconductor companies who are pursuing DFT test methodologies. Prior to
joining Inovys, Al was a Principal Member of Technical Staff and DFT Manager for
the Embedded Platform Solutions Organization at Motorola. Al's 20 years of
experience in semiconductor design and test has also included DEC and Texas
Instruments. During his career, Al has advocated improvements in test strategies
in which he holds 13 patents. He is the widely read author of Design-For-Test
For Digital IC's and Embedded Core Systems, in addition to many articles
published in EE Times, and IEEE Design & Test. Al has frequently contributed to
the International Test Conference as Presenter, Panel Member, Session Chair, and
Paper Reviewer of DFT methodologies. Al has been a lecturer at University of New
Mexico and at University of Texas as well as the Tutorial Session at the Design
Automation Conference.
Advanced Micro Devices
Grady Giles received a BS in Physics at
Texas A&M University and has been a DFT specialist for more than 20 years. He
has worked on microprocessors and embedded memories at Texas Instruments,
Motorola, and Advanced Micro Devices. He has contributed his talents to such
IEEE test technology activities as the International Test Conference, Std 1149.1
and Std P1500. He has coauthored numerous papers one of which received the Best
Paper Award at ITC in 1991. He is listed as an inventor on ten U.S. patents.
Grady prides himself on a career history of pushing the DFT envelope and of
winning collaborations between design and test engineers and automation
providers.
President & CEO: SynTest Corp
Dr. Wang founded SynTest in January 1990. Since then, Dr. Wang has led the company to grow to more than 60 full-time employees and 200 customers worldwide. Along with overall management responsibility for worldwide operations, he is also responsible for defining SynTest's technology roadmap. Prior to founding SynTest, Dr. Wang had worked at several technology companies, including Intel and Daisy Systems.
Dr. Wang has published more than 30 technical papers and filed a number of patents in the area of Test Generation, Built-in Self-Test (BIST), and Design for Testability. He received his MSEE and EE Ph.D. degrees from Stanford University, and his BSEE and MSEE from National Taiwan University, Taiwan.
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