| Product
Description
SAJE JTS has been developed by SiliconAid Solutions to provide a low-cost
production ready IEEE Std. 1149.1 and 1149.6 boundary scan implementation.
The tool utilizes a BSDL-centric approach that supports Verilog synthesizable
design flows. SAJE JTS represents a cost effective means to develop and
implement IC product specific DFT strategies when used in conjunction
with today’s complex-fault modeling ATPG tools and the SAJE JTV
JTAG verification tool.
JTAG is a BSDL-centric board-test approach. For
a device to be JTAG compliant, an associated verified BSDL file must be
provided to drive the board-level automatic test pattern generator. Therefore,
the problem from the semiconductor manufacturer product perspective is
to create a verified JTAG-compliant device, an associated verified BSDL
file, and production test patterns.
For design scenarios with no BSDL starting-point
file, SAJE JTS can read a Verilog design prior to JTAG insertion and automatically
generate a BSDL file. Generation is per pre-defined tool defaults supplemented
with user-defined commands. Public instructions are supported but some
instructions require additional customized design. User instructions,
Runbist, and analog test receivers require additional design for test
development that may be addressed with SiliconAid consulting assistance
as required.
Using the BSDL file, the SiliconAid SAJE JTV tool
can generate a custom testbench and a suite of test patterns to verify
design functionality using Verilog simulation. SAJE JTS provides a testbench
customization file to facilitate the SAJE JTV tool’s ability to
verify many internal JTAG design nodes as well as external pins. Successful
verification includes both the JTAG Verilog design and the associated
BSDL file.
The SAJE JTV tool can also provide chip manufacturing
production test patterns. The SAJE JTS and JTV tools provide the chip
designer with a complete solution for designing JTAG, verifying JTAG design
and BSDL correctness, and generating test patterns for production tester.
SAJE JTS Features
• Generates synthesizable Verilog JTAG design defined by BSDL file
• BSDL file can be learned from non-JTAG Verilog design
• Verilog can be RTL or gate-level statements
• Generates IEEE 1149.1 compliant boundary scan logic
o Supports IEEE Std. 1149.1-2001 Standards
o Supports all public instructions
o Intest and Runbist require additional design
• Generates library of JTAG functions
o Includes synthesizable Verilog RTL
for JTAG functionality
o Includes non-synthesizable version of analog test receiver for digital
simulation
• Flip-flop-based design, gated
or non-gated clocking styles
• User friendly graphical-user-interface(GUI)
• Interactive or command-line control from Dofile
• Generates a testbench customization file for the SAJE JTV verification
tool
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