SiliconAid Solutions - Advisory Board

SiliconAid Solutions seeks guidance and advice from an advisory board consisting of Design-for-Test and SoC development industry leaders. They are essential in delivering the best quality possible to our customers.


Magdy S. Abadir
Received the B.S. degree with honors in Computer Science from the University of Alexandria, Egypt in 1978, the M.S. degree in Computer Science from the University of Saskatchewan, Saskatoon, Canada, in 1981, and the Ph.D. degree in Electrical Engineering from the University of Southern California, Los Angeles, in 1985. He worked at Motorola as the Manager of the High Performance Tools and Methodology Group at the Advanced Systems and Platform Group in Austin Texas. Prior to that he was the General Manager of Best IC Labs in Austin Texas. From 1986 to 1994 he worked at the Microelectronics and Computer Technology Corporation (MCC). He is also an adjunct faculty member of the Computer Engineering Department at the University of Texas at Austin. Dr. Abadir has published over 100 technical journal and conference papers in the areas of microprocessor test and verification, test economics, expert systems, and design for test. He founded and chaired three workshops on microprocessor test and verification. He also co-chaired five workshops on the economics of design, test and manufacturing. He co-edited three books on the subject of test economics. He is a senior member of the IEEE.

President: Bennetts Associates : Retired
Dr. R.G. "Ben" Bennetts is retired from being President of Bennetts Associates and an independent consultant in Design-For-Test (DFT), consulting in product life-cycle DFT strategies, and delivering on-site and open educational courses in DFT technologies. In a career spanning over thirty years, he has worked in the Electronic Design Automation industry with LogicVision (96 - 97) and Synopsys (93 - 95), where he assisted with the specification of DFT synthesis products and development of the DFT market. Ben has extensive experience as an independent DFT consultant (86 - 93) advising on technical and marketing activities in test technology, test strategies and DFT techniques for ASICs, boards and systems and lecturing extensively on these topics. During this time, he was a member of JTAG, the organization that created the IEEE 1149.1 Boundary-Scan Standard.


Chief Scientist: ASSET INTERTECH
Mr. Crouch is responsible for research and the generation of development plans for new DFT methodologies, as well as providing technical consultancy to semiconductor companies who are pursuing DFT test methodologies. Prior to joining Inovys, Al was a Principal Member of Technical Staff and DFT Manager for the Embedded Platform Solutions Organization at Motorola. Al's 20 years of experience in semiconductor design and test has also included DEC and Texas Instruments. During his career, Al has advocated improvements in test strategies in which he holds 13 patents. He is the widely read author of Design-For-Test For Digital IC's and Embedded Core Systems, in addition to many articles published in EE Times, and IEEE Design & Test. Al has frequently contributed to the International Test Conference as Presenter, Panel Member, Session Chair, and Paper Reviewer of DFT methodologies. Al has been a lecturer at University of New Mexico and at University of Texas as well as the Tutorial Session at the Design Automation Conference.


   Advanced Micro Devices
Grady Giles received a BS in Physics at Texas A&M University and has been a DFT specialist for more than 20 years. He has worked on microprocessors and embedded memories at Texas Instruments, Motorola, and Advanced Micro Devices. He has contributed his talents to such IEEE test technology activities as the International Test Conference, Std 1149.1 and Std P1500. He has coauthored numerous papers one of which received the Best Paper Award at ITC in 1991. He is listed as an inventor on ten U.S. patents. Grady prides himself on a career history of pushing the DFT envelope and of winning collaborations between design and test engineers and automation providers.


President & CEO: SynTest Corp
Dr. Wang founded SynTest in January 1990. Since then, Dr. Wang has led the company to grow to more than 60 full-time employees and 200 customers worldwide. Along with overall management responsibility for worldwide operations, he is also responsible for defining SynTest's technology roadmap. Prior to founding SynTest, Dr. Wang had worked at several technology companies, including Intel and Daisy Systems.

Dr. Wang has published more than 30 technical papers and filed a number of patents in the area of Test Generation, Built-in Self-Test (BIST), and Design for Testability. He received his MSEE and EE Ph.D. degrees from Stanford University, and his BSEE and MSEE from National Taiwan University, Taiwan.