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When : May 24
th & 25th, 2006

Where : Omni South Hotel, Austin TX

Who Should Attend : Anyone interested in learning more about DFT methods for practical real world chip applications. DFT engineer, Test/Product Engineers, FA engineers, middle to upper managers.

CLICK HERE to register for Tutorial (May 24th)

CLICK HERE to register for Technical Day (May 25th)

 Event Description

This 2 day DFT event will be held at the Omni South Hotel. This event will consist of a day of a DFT class and a day open technical day. The technical day will be a mix of vendors and guest presenters. The technical day is FREE and is open to all when you pre-register on this web site. You can register for the conference now. Class registration is open on a first come first serve bases.

DFT Class (May 24th)

JTAG Tutorial - Give by two of the best JTAG engineers in the US (Bill Bruce and Carl Barnhart). This FREE one day tutorial will cover an overview for all the IEEE JTAG related specifications. The Day will also include a detailed description of 1149.1 and 1149.6.

Free Technical DFT Day (May 25th)

The technical day is a FREE day to any and all web-registered attendees. DFT and test engineers from the semiconductor industry and the EDA community will be presenting. The day will start with a Key Note Speaker followed by 6 to 8 technical talks and presentations. We expect to exceed over 150 attendees for the final day of the event. DFT Companies will also be setting up small booth demonstrations in the hallway just outside of the main conference hall. See below for the Agenda!

CLICK HERE to register for Technical Day (May 25th)                                                                   

8:00 - 8:30 On site Registration (coffee provided)
8:30 - 9:10 Key Note Address – Ken Butler : Texas Instruments

Session 1 – Yield Impacts of DFT                 Chair: Jay Bedsole
9:10 - 9:40 - Andy Hughes (Cadence) Yield Diagnostics
9:40 - 10:10 - Greg Yeric (Synopsys) Yield Analysis
10:10 - 10:45  B R E A K
10:45 - 11:15 - Carl Barnhart (SiAid) JTAG flavors
Session 2 – DFM                                             Chair: Al Crouch
11:15 - 11:45 - Al Crouch - Data Collection for Yield
11:45 - 1:30 LUNCH - Free lunch sponsored by SiliconAid
1:30 - 2:00 - Raj Raina (Freescale) - Challenges in 65ns
2:00 - 2:30 -
David Eppes (AMD) - SRAM FA and Debug
2:30 - 3:00  B R E A K
Session 3 – DFT and Debug                      Chair: Andy Halliday
3:00 - 3:30 - Jayant D'Souza (Mentor) - At speed testing
3:30 - 4:00 -
Jason Doege (DA-Test) - Fixing Transition Delay
4:00 - 4:30 - Abhijit Jas (Intel) - Minimizing Functional Constraints
4:30 - 5:30 - Panel Discussion                  Referee: Jim Johnson
5:30  - 6:30 Happy Hour

Vendor Booths open from 8:30am - 6pm


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